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Scanning probe microscopy
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201	Test objects and other epistemic things: a history of a nanoscale object Add to Reading List Source URL: www.owlnet.rice.edu Language: English - Date: 2010-09-13 10:55:08 Microbiology Microscopes Nanotechnology Experimental system Electron microscope Materials science Optical microscope Transparency and translucency Karin Knorr Science Scientific method Scanning probe microscopy
202	Microsoft PowerPoint - ENGS-AFM [Compatibility Mode] Add to Reading List Source URL: nanofab.caltech.edu Language: English - Date: 2013-01-21 22:21:44 Microscopes Chemistry Scanning tunneling microscope Intermolecular forces Atomic force microscopy Microscopy Canton of Neuchâtel Conductive atomic force microscopy NanoWorld Scanning probe microscopy Science Scientific method
203	Contribution for Quantsol 2011 Winter Workshop Correlation between conductivity and structural evolution of Si-rich silicon oxide films annealed at different temperatures Bert Stegemann1, Thomas Lussky2, Andreas Schöpk Add to Reading List Source URL: www.quantsol.org Language: English - Date: 2011-03-17 17:06:50 Semiconductor devices Emerging technologies Quantum electronics Scanning probe microscopy Intermolecular forces Atomic force microscopy Silicon dioxide Quantum dot Annealing Chemistry Technology Materials science
204	Microsoft Word - Press_release_attocube.doc Add to Reading List Source URL: www.qdusa.com Language: English - Date: 2011-08-19 15:03:58 Science Microscope Optical microscope Scanning probe microscopy Confocal microscopy Microscopy Microbiology Scientific method
205	Nanotechnology Solutions Partner Park Systems IncOlcott St. Santa Clara, CATel. +Fax. +www.parkAFM.com Park Systems Singapore. No51, Ubi Avenue 1, #06-09A Paya Ubi Industrial P Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Chemistry Magnetic force microscope Near-field scanning optical microscope Microscopy Park Systems Kelvin probe force microscope Scanning tunneling microscope Microscope Atomic force microscopy Scanning probe microscopy Science Scientific method
206	Nanotechnology Solutions Partner Park Systems Singapore. 33, Ubi Avenue 3, #07-47 Vertex Tower A SingaporeTel: +Mobile: +www.parkAFM.com © 2011 Park Systems Corp. All rights reserved. Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Intermolecular forces Chemistry Atomic force microscopy Nanotechnology Park Systems Scanning electron microscope Nanometrology Vibrational analysis with scanning probe microscopy Magnetic force microscope Scientific method Science Scanning probe microscopy
207	Dimension FastScan The World’s Fastest AFM Innovation with Integrity Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2013-10-28 06:25:22 Chemistry Atomic force microscopy Magnetic force microscope Microscopy Conductive atomic force microscopy Scanning capacitance microscopy Nanoindentation Scanning tunneling microscope Microscope Scanning probe microscopy Science Scientific method
208	Critical Dimensions Measurement of High Aspect Ratio Trench with XE AFM >>> Figure 1. (a) XE Scan System separates the Z-scanner from Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Chemistry Intermolecular forces Atomic force microscopy Park Systems Microscopy Image scanner Vibrational analysis with scanning probe microscopy NanoWorld Science Scientific method Scanning probe microscopy
209	Nanotechnology Solutions Partner Park Systems IncOlcott St. Santa Clara, CATel. +Fax. +www.parkAFM.com Park Systems Singapore. No51, Ubi Avenue 1, #06-09A Paya Ubi Industrial P Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Chemistry Magnetic force microscope Near-field scanning optical microscope Microscopy Park Systems Scanning tunneling microscope Kelvin probe force microscope Nanometrology Chemical force microscopy Scanning probe microscopy Science Scientific method
210	Automatic Defect Review AFM for Hard Disk Media and Substrates Nanotechnology Solutions Partner For more information: www.parkAFM.com Add to Reading List Source URL: www.nanowerk.com Language: English - Date: 2011-11-12 18:00:00 Park Systems Scanning probe microscopy Intermolecular forces KLA Tencor Atomic force microscopy Hard disk drive Nanotechnology Computer hardware Science Technology

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